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Bitstream-based simulation approach was proposed and experimentally validated by heavy ions and protons in Xilinx Virtex-4 FPGAs. The simulation approach is able to predict the probability of an SEU to reduce a functional failure. With the existence of the SEU sensitivity data of the configuration memories, the functional failure probability of any implemented circuit can be calculated not by experiment...
Reconfigurable SRAM-based FPGAs are highly susceptible to radiation induced single-event upsets (SEUs) in space applications. The bit flip in FPGAs configuration memory may alter user circuit permanently without proper bitstream reparation, which is a completely different phenomenon from upsets in traditional memory devices. It is important to find the relationship between a programmable resource...
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