The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Regarding modeling of battery system, if the properties of unit cells comprising the system are different, overall battery system model based on a specific cell may cause an error due to the differences in cell properties. In this paper, the statistical method to minimize the error according to the deviation of properties of unit cells comprising the battery module is proposed. The simulation result...
We observed Single Bit Read Disturb failure in SRAM blocks with embedded Flash process. Such failures are not observed in pure logic process because pure logic process does not require additional thermal budget. In embedded Flash process, static Noise Margin (SNM) and leakage current degrades, causing more Single Bit Failure (SBF) at high VCC and/or high temperature. We optimized SRAM bitcell's transistor...
High speed array architecture and cell optimization in the Uniform Channel Program and Erase (UCPE) floating gate 2 transistor (2T)-embedded flash cell (eFlash) are investigated. It is important to optimize select gate (SG) channel length from 2T-eFlash test array when CG flash device width/length and SG length are pre-determined by other constraints. SG-punch through (PT) driven Gate Disturb (GD)...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.