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Phosphorus-carbide (CP x ) thin solid films have been deposited by unbalanced reactive magnetron sputtering from a compound C-P target and investigated by transmission electron microscopy, X-ray photoelectron spectroscopy, scanning electron microscopy, elastic recoil detection analysis, Raman scattering spectroscopy, nanoindentation, and four-point electrical probe techniques. CP x ...
Inherently nanostructured CP x compounds were studied by first-principles calculations. Geometry optimizations and cohesive energy comparisons show stability for C 3 P, C 2 P, C 3 P 2 , CP, and P 4 (P 2 ) species in isolated form as well as incorporated in graphene layers. The energy cost for structural defects, arising from the substitution...
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