Search results for: D. Dallet
2006 IEEE Nuclear Science Symposium Conference Record > 1 > 375 - 379
IEEE Transactions on Instrumentation and Measurement > 2006 > 55 > 5 > 1536 - 1545
Measurement > 2002 > 31 > 2 > 77-91
Microelectronics Reliability > 1999 > 39 > 6-7 > 1095-1101