Search results for: Jeong-Won Yoon
Journal of Materials Science: Materials in Electronics > 2019 > 30 > 22 > 20205- 20212
Journal of Materials Science: Materials in Electronics > 2019 > 30 > 14 > 12911- 12923
Surface and Interface Analysis > 50 > 11 > 1046 - 1050
Microelectronic Engineering > 2018 > 198 > C > 15-21
Thin Solid Films > 2018 > 660 > C > 618-624
Journal of Materials Science: Materials in Electronics > 2018 > 29 > 6 > 4724-4731
Journal of Electronic Materials > 2018 > 47 > 1 > 430-435
Metals and Materials International > 2017 > 23 > 5 > 958-963
Microelectronic Engineering > 2017 > 180 > C > 52-55
Microelectronics Reliability > 2017 > 71 > Complete > 119-125
Journal of Materials Science: Materials in Electronics > 2017 > 28 > 11 > 7827-7833
Surface and Interface Analysis > 48 > 7 > 493 - 497
Journal of Materials Science: Materials in Electronics > 2016 > 27 > 2 > 1105-1112
Journal of Alloys and Compounds > 2015 > 627 > Complete > 276-280
Journal of Materials Science: Materials in Electronics > 2015 > 26 > 3 > 1649-1660
Microelectronics Reliability > 2014 > 54 > 2 > 410-416
Metals and Materials International > 2014 > 20 > 3 > 515-519
Microelectronics Reliability > 2013 > 53 > 12 > 2036-2042
Microelectronic Engineering > 2013 > 103 > Complete > 1-6