Search results for: T. Osipowicz
2007 IEEE International Electron Devices Meeting > 131 - 134
Nuclear Inst. and Methods in Physics Research, B > 2007 > 260 > 1 > 124-129
Nuclear Inst. and Methods in Physics Research, B > 2007 > 260 > 1 > 455-459
Microsystem Technologies > 2007 > 13 > 5-6 > 431-434
Nuclear Inst. and Methods in Physics Research, B > 2006 > 251 > 2 > 352-360
Nuclear Inst. and Methods in Physics Research, B > 2006 > 249 > 1-2 > 915-917
Thin Solid Films > 2006 > 504 > 1-2 > 81-85
Nuclear Inst. and Methods in Physics Research, B > 2005 > 231 > 1-4 > 389-393
Nuclear Inst. and Methods in Physics Research, B > 2005 > 231 > 1-4 > 170-175
Nuclear Inst. and Methods in Physics Research, B > 2005 > 231 > 1-4 > 446-451
Journal of Electronic Materials > 2005 > 34 > 8 > 1110-1114
Applied Physics A > 2005 > 81 > 6 > 1163-1166
Applied Surface Science > 2004 > 237 > 1-4 > 416-420
Journal of Crystal Growth > 2004 > 268 > 3-4 > 494-498
Nuclear Inst. and Methods in Physics Research, B > 2004 > 222 > 1-2 > 53-60
Journal of Crystal Growth > 2004 > 264 > 1-3 > 58-63
Microelectronic Engineering > 2004 > 71 > 1 > 104-111
The European Physical Journal B > 2004 > 41 > 2 > 201-205