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Using ultrasharp conductive tip atomic force microscopy (c-AFM), we have measured the current voltage (I-V) characteristics of titanium ions implanted into polystyrene thin film spin coated onto silicon substrate. The surface morphology and the electric current between the tip and sample have been obtained simultaneously on the nanometer scale. Initial island-like growths structures were observed...
Plasma immersion ion implantation (PIII) has been used with a filtered cathodic arc to implant copper and carbon ions into poly(tetrafluoroethylene) (PTFE). The PTFE substrates for the copper implantation were placed perpendicular to the plasma beam, whilst those for carbon implantation were oriented parallel to the drift velocity of the beam to minimise the deposition of low energy ions. Electrodes...
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