Search results for: R. Wang
2016 IEEE International Electron Devices Meeting (IEDM) > 27.4.1 - 27.4.4
Neuroscience > 2014 > 263 > C > 216-230
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341