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With the advent of the double-hexapole aberration corrector in transmission electron microscopy the spherical aberration of the imaging system has become a tunable imaging parameter like the objective lens defocus. Now Zernike phase plates, altering the phase of the diffracted electron wave, can be approximated more perfectly than with the lens defocus alone, and the amount of phase change can be...
Recently an electromagnetic hexapole system for the correction of the spherical aberration of the objective lens of a 200kV transmission electron microscope has been constructed by Haider and coworkers. By appropriately exciting the hexapole elements it is possible to adjust specific values of the spherical aberration coefficient ranging from the value of the original uncorrected instrument over zero...
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