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Soft X‐ray spectromicroscopy at the O K‐edge, U N4,5‐edges and Ce M4,5‐edges has been performed on focused ion beam sections of spent nuclear fuel for the first time, yielding chemical information on the sub‐micrometer scale. To analyze these data, a modification to non‐negative matrix factorization (NMF) was developed, in which the data are no longer required to be non‐negative, but the non‐negativity...
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