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The ever-shrinking world of semiconductors has always challenged the interplay of tool capability, process integration, and characterization. The fine line between structural or electrical success and failure has steadily been redefined from microns to nanometers with leading edge technology using terms with the likes of angstroms and layers of atoms. Failure modes at these nodes become increasing...
The SRAM bitcell array has been traditionally used as a yield learning vehicle for new technologies. However, the yield of the SRAM bitcell is susceptible to parametric variations and subtle process defects/variations. In this paper, a new functional array called the tristated inverter array is discussed which is much less susceptible to both parametric variation and subtle process defects while retaining...
The SRAM bitcell array has been traditionally used as a yield learning vehicle for new technologies. However, the yield of the SRAM bitcell is susceptible to parametric variations and subtle process defects/ variations. In this work a new functional array called the Tristated Inverter Array (TIA) is discussed which is much less susceptible to both parametric variation and subtle process defects while...
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