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In situ X-Ray Diffraction, X-Ray Reflectivity and High Resolution Transmission Electron Microscopy were used to investigate the sequence and the texture of phase formation during the solid-state reaction of Ni thin film with GaAs substrate. These results show the formation of a unique Ni3GaAs crystalline phase at 200°C that remains stable until 400°C. The epitaxial relationships between this phase...
The redistribution of Pt after heat treatment at 290°C for 1h has been analyzed by large-angle atom probe tomography assisted by femtosecond laser pulses. Two silicides Ni 2 Si and NiSi were found together with the solid solution of Ni and Pt. The redistribution of Pt at the Ni 1−x Pt x /Ni 2 Si interface is a clear illustration of the snowplow effect. A segregation...
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