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The users of today's test systems are seeking integration solutions to marry multiple test standards (VXI/ PXI/LXI) into a common chassis (Fig. 1). This paper will describe how a hybrid implementation of the IEEE-P1693 Modular Interconnect Packaging for Scalable Systems (MIPSS) draft standard [1] can accomplish that and provide benefits of less cost, smaller footprint and be transparent to what test...
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