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Bi2Te3 alloys were fabricated through thermal annealing of multilayered Bi/Te thin films as well as by co-sputtering of Bi and Te. In both cases, sharp X-ray diffraction peaks of Bi2Te3 were evidenced, indicating good crystallinity. It was found that the heterogeneous interface suppressed the grain growth in the multilayered samples considerably, and thus the thermal conductivity was reduced as a...
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