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The technique of Test Sequence Generation (TSG) plays a key role in Built-In Self-Test (BIST) architecture implementation. Major problem with any test sequence generator is to produce long, unpredictable key sequences which can be applied to Circuit Under Test (CUT) in order to detect the faults efficiently. Digital Systems/Circuits are tested by inducing appropriate stimuli and checking the responses...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.