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(Pb0.7Sr0.3)MgxTi1–xO3–x (x = 0 ∼ 0.3) thin films were successfully prepared on ITO/glass substrate by sol-gel technique. The crystalline phase structures were measured through X-ray diffraction (XRD). The dielectric properties were measured by a precision impedance analyzer. Results show that the perovskite phase was stable in (Pb0.7Sr0.3)MgxTi1–xO3–x thin film. Its lattice constant was found...
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