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We examine transport through a spin-1/2 Kondo impurity, patterned between atomic scale electrodes in the presence of side-coupled nanographene flake. Impurity is attached to the edge of the flake, what allows to test the edge states. The Kotliar Ruckenstein slave boson approach is adopted to describe the strongly correlated impurity. We show that transport measurement of Fano-Kondo effect can serve...
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