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Drift mobility of holes in antrachinone and anthrone polycrystalline thin films evaporated in the vacuum of the order of 10-5 Torr was measured with time-of-flight- method. The one order difference in mobility values for both -four ring acenes purified with zone melting before vaporization and identical in crystallization structure but with different molecule symmetry may have the origin in the presence...
The drift mobility of holes in the antrachinon layers were determined. The layers were evaporated in the vacuum of the order of 10-5Torr. Due to the substrate temperature the layers were in the structure polycrystalline or the quasi-amorphous. There were no obtained the effect of the layers structure on the magnitude of the mobility of the carriers and on the transport mechanism.
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