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Deposition of compound thin films with reactive magnetron sputtering method causes a lot of difficulties, of which the main ones are the instability of the process and decrease of the deposition rate. Computer simulations were performed using Berg’s model assumptions. Firstly, effect of basic process parameters on aluminum oxide deposition was examined, also theoretical characteristics of the deposition...
Aluminium oxide trhin films were deposited with high rate reactive pulsed magnetron sputtering of the aluminium target in argon and oxygen mixture. Experiments showed that properties of achieved films were comparable for conventionally sputtered layers. The main purpose was to explain behaviour of the high rate sputtering classical Berg's model. The parameters which were important for efficiency of...
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