Search results for: J. Jaglarz
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Angle Resolved Scattering Combined with Optical Profilometry as Tools in Thin Films and Surface Survey
Acta Physica Polonica A > 2015 > 128 > 1 > 81-86
The work presents an application of two scanning optical techniques, i.e. optical profilometry and angle resolved scattering method. The first method measures the light reflected from a film during scan of the surface, while the second method measures light intensity as a function of the scattering angle. The angle resolved scattering and optical profilometry measurements, being complementary to the...
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- LIGHT SCATTERING (5)
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- SEMICONDUCTORS (4)
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