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Ultra-thin Na0.5Bi0.5TiO3 films were epitaxially deposited on (001)SrTiO3 substrate by pulsed laser deposition. From the ellipsometric spectra collected in the photon energy range 2÷8.7eV, real and imaginary parts of the complex dielectric function were determined. It was found, that the electronic transitions related to the fundamental absorption edge are of indirect type, which is confirmed by ab...
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