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Zn/CuIn3Se5 polycrystalline thin films have been deposited by flash evaporation on a Corning 7059 glass substrates. The films have been investigated by X-ray diffraction (XRD) for the phase structure, scanning electron microscopy, atomic force microscopy (AFM) for the morphology and optical transmission to determine the band gap. X-ray patterns revealed that Zn/CuIn3Se5 films are polycrystalline in...
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