The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
There is a method of global parametric faults location in analogue integrated circuits presented in this paper. Circuit Under Test is diagnosed in the time domain. The method is based on a utilisation of the tested device response and its derivative base features, i.e. following maxima and minima. The set consisted of base features is transformed into an advanced feature. Base features and the advanced...
This paper describes new method of fault diagnosis in analog electronic circuits (AEC). Fault diagnosis in analog electronic circuits is in general tested along with one dimension: the generator frequency. In this paper, we present a novel approach that uses more than one dimension to test AEC (those new dimensions are: the load resistance & reactance, generator resistance & reactance). Proposed...
In the paper the application of the SVM (support vector machine) algorithm has been used for diagnosis and test of analog electronic circuits in time domain. Procedure designed belongs to simulation before test technique, where the fault models should be assumed at the before test stage (prototype stage). Both, parametric and catastrophic faults based on standard fault models are considered. Selected...
This paper describes how increasing number of dimension of search space (in analog circuit diagnosis) can influence on identification of states of circuit under test (CUT). The criterion of optimization is the maximum number of identified states of CUT. In order to achieve this goal, first each state S and ambiguity set AS must be find and then optimized using Particle Swarm Optimization (PSO) algorithm...
An evolutionary technique for a linear analog circuit state recognition is presented in this paper. Transfer function zeros, poles and its amplification coefficient are determined by means of differential evolution. Time responses to a unit step stimulus for the circuit under test and for the evaluated phenotype are compared during the fitness calculation. Absolute response error of phenotype is minimized...
The method presented in this paper uses evolutionary computations to analog circuit testing stimulus shape optimization. The proposed testing excitation is a PWL waveform that generates responses of the tested circuit with appropriate relationship between current values of its specifications and the value of the observed parameter. The energy of error signal between nominal and actually obtained responses...
The testing and diagnosis catastrophic faults technique for analog high frequency (HF) circuits (passive filters and impedance matching circuits) is described in this paper. The novel method based on load and frequency as testing pair has been proposed. The impact of load on testing and diagnostic has been investigated. The best pairs of load and frequency have been chosen. The proposed approach of...
W artykule przedstawiono analizę wpływu globalnych uszkodzeń parametrycznych na odpowiedź analogowych układów scalonych (AIC) w dziedzinie czasu. Nowością jest wykorzystanie relacji oraz super-relacji pomiędzy wcześniej wspomnianymi cechami odpowiedzi układów. Przedstawiona metoda powinna pozwolić na zwiększenie testowalności oraz diagnozowalności globalnych uszkodzeń parametrycznych (GPF) w produkcji...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.