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The calculation of the threshold crossing time of the on-chip very large scale integration (VLSI) interconnects is an important part of interconnect simulation. The paper focuses on low-loss on-chip upper layer interconnect simulation. The work presents a new way of calculating the closed form output voltage and threshold crossing time formulas based on differential equation multiple scales solving...
The paper presents a new method of deriving the closed form formula for the output voltage and threshold crossing time for low-loss on-chip upper layer interconnects The threshold crossing time solution for the ramp excitation is derived. The calculation of output voltage of two coupled interconnects for the ramp input is also presented.
In the paper the new method of computing the threshold crossing times for the low-loss interconnect is presented. The interconnect output response is calculated using the multiple scales method with the perturbation parameter related to the line losses. From the derived formula, the analytical form for threshold crossing time is obtained. The algorithm that uses the step response calculations for...
In the paper we present the approach in order to estimate a crossing time of the step response for the lossless and low-loss transmission lines. There is derived a closed form solutions to the crossing time for such lines when the overshoots appear. For the low-loss lines the method bases on the simplification that allows to specify the exact terms in the step response calculations
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