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The 3 D interconnect technology with Thru Silicon Via (TSV) have gained tremendous advancement in recent years. Final adoption of TSV technologies requires a robust and cost competitive TSV processes. Sidewall plated TSV with polymer filling can reduce half of total process steps from TSV copper (Cu) seed deposition to front-via1 expose. TSV plating time can be reduced ~ 60% for sidewall plated TSV...
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