Search results for: Y. Yu
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Electron Device Letters > 2011 > 32 > 2 > 128 - 130
IEEE Electron Device Letters > 2010 > 31 > 8 > 779 - 781
IEEE Electron Device Letters > 2010 > 31 > 5 > 396 - 398