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ToF-SIMS was used to characterize the surface of nickel phosphorus (NiP) layers that were electrolessly plated on aluminum substrates of magnetic recording disks. X-ray photoelectron spectroscopy (XPS) was also used to study the bonding nature of phosphorus and nickel. ToF-SIMS and XPS results showed that the NiP surface is oxidized and composed of nickel oxide, nickel hydroxide, nickel phosphate,...
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