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Mismatch drift is a major process reliability issue for analog and mixed-signal designs. Mismatch stability was examined for a 0.8- mu m CMOS process using a cascode current minor test circuit. After 1000-h burn-in at 125 degrees C under matched gate voltage stress, no drift in parameter matching was measured. However, for the same burn-in conditions with unmatched gate voltage stress, drifts in threshold...
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