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We performed gate ramp voltage stress on III-V InGaAs based MOSFETs. Stress induces trapped charge and it also leads to interface trap generation, which has detrimental effects on the subthreshold slope and on the transconductance. At high electric fields, before the hard breakdown, a very low-frequency high-current random telegraph noise appears at the gate, which seems to be not correlated with...
Degradation of the Ni/yttria‐stabilised zirconia (YSZ) anode of the solid oxide fuel cell has been evaluated in the coal syngas containing different PH3 concentrations in the temperature range from 750 to 900 °C. Thermodynamic equilibrium calculations show that PH3 in the coal syngas gas is converted mostly to P2O3 at 750–900 °C. The phosphorous impurity reacts with the Ni‐YSZ anode to form phosphates...
Trace impurities in coal-derived syngas pose a threat on the performance and durability of solid oxide fuel cells (SOFCs) operated in syngas. A Ni–YSZ/YSZ/Ni–YSZ (YSZ stands for yttria-stabilized zirconia) half-cell is constructed in order to evaluate the effects of a phosphorus impurity on the performance of the Ni–YSZ cermet anode in the simulated coal-derived syngas containing 30.6% H 2 ...
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