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Thin Films
In article number 2210562, Ruijuan Xu, Kevin J. Crust, Varun Harbola, and co‐workers report intrinsic size‐driven scaling in lead‐free antiferroelectric thin films. They demonstrate an intriguing antiferroelectric‐to‐ferroelectric transition upon reducing the thickness of antiferroelectric NaNbO3 membranes. The image shows the coexistence of ferroelectric and antiferroelectric phases in...
Despite extensive studies on size effects in ferroelectrics, how structures and properties evolve in antiferroelectrics with reduced dimensions still remains elusive. Given the enormous potential of utilizing antiferroelectrics for high‐energy‐density storage applications, understanding their size effects will provide key information for optimizing device performances at small scales. Here, the fundamental...