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Recent research has shown that tests generated without taking process variation into account may lead to loss of test quality. At present there is no efficient device-level modeling technique that models the effect of process variation on resistive bridges. This paper presents a fast and accurate technique to model the effect of process variation on resistive bridge defects. The proposed model is...
Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires more than one voltage setting for 100% defect coverage; however switching between several supply voltage settings has a detrimental impact on the overall cost of test. This paper proposes an effective Gate Sizing technique for reducing...
Multiple-voltage is an effective dynamic power reduction design technique, commonly used in low power ICs. To the best of our knowledge there is no reported work for diagnosing multiple-Vdd enabled ICs and the aim of this paper is to propose a method for diagnosing bridge defects in such ICs. Using synthesized ISCAS benchmarks, with realistic extracted bridges and parametric fault model; the paper...
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