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In this paper, the problem of uncertainty on reference nodes positions is addressed in the context of hybrid data fusion techniques for localization. This problem arises in B3G networks where different location-dependent observables come from heterogeneous Radio Access Networks (RAN) leading to different levels of uncertainty on both ranges and anchor nodes positions. We assume a Gaussian model on...
Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. Soft error rate (SER) measurement, expressed as number of failures encountered per billion hours of device operation, is time consuming and involves significant test cost. The cost stems from having to connect a device-under-test to a tester for...
For several decades, the output from semiconductor manufacturers has been high volume products with process optimisation being continued throughout the lifetime of the product to ensure a satisfactory yield. However, product lifetimes are continually shrinking to keep pace with market demands. Furthermore there is an increase in dasiafoundrypsila business where product volumes are low; consequently...
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