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This paper presents a physical-aware diagnosis technique for failing dies with multiple interconnect defects, including open and bridging. Our diagnosis technique considers fault masking/reinforcement and Byzantine effects. We use a section, a piece of interconnect, as the physical-aware diagnosis unit. We adopt the Single Location in a Cluster (SLIC) technique, where sections with similar simulation...
In a complex sequential circuit, the problem of fixing min-delay violations becomes more and more important. To our knowledge, no efficient approach is proposed to eliminate the min-delay violations in a layout-level implementation. In this paper, the min-delay violations in a layout-level implementation are considered. By using the available space along the routing wires, redundant loads can be inserted...
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