Search results for: Hong Gao
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 463 - 471
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 681 - 688
Physics Letters A > 2004 > 331 > 1-2 > 117-124
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 463 - 471
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 681 - 688
Physics Letters A > 2004 > 331 > 1-2 > 117-124