The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
AFM-based single abrasive abrasion process is widely employed in the surface micro/nanomachining for fabrication of structures at the nanometer scale. The wear depth and roughness are significantly important in the application of these structures. To study effects of scratching directions on the wear depth and roughness within the wear mark, single groove scratching test and wear test on the surface...
To investigate effects of tip geometry on AFM nanoscratching process, an experimental calibration method measuring three-dimensional (3D) scratching forces based on the cantilever deflection is presented. On the surface of single crystal copper and silicon, nanoscratching tests are carried out using a pyramidal diamond tip. Effects of tip geometry (including the hemisphere of the tip and three sides...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.