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Depth profile analysis (argon ion etching/X-ray photoelectron spectroscopy) was conducted on a series of Fe–16Cr–16Ni–2Mn–1Mo–2Si austenitic stainless steel samples oxidized at 973 and 1073K with exposure times of 25, 100, 193, 436 and 700h. Surface and near surface rearrangement following oxidation resulted in a region of high Cr concentration on all oxidized samples. Temperature and time dependence...
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