Search results for: Hui Ren
Microelectronics Reliability > 2017 > 75 > C > 127-134
Microelectronics Reliability > 2014 > 54 > 3 > 633-640
Microelectronics Reliability > 2013 > 53 > 7 > 1021-1028
Microelectronics Reliability > 2011 > 51 > 8 > 1377-1384