Search results for: Kun Liu
IEEE Electron Device Letters > 2009 > 30 > 8 > 820 - 821
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 265 - 268
IEEE Electron Device Letters > 2009 > 30 > 8 > 820 - 821
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 265 - 268