Search results for: Bin Liu
SID Symposium Digest of Technical Papers > 50 > S1 > 669 - 672
International Journal of System Assurance Engineering and Management > 2019 > 10 > 4 > 739-745
IEEE Transactions on Reliability > 2017 > 66 > 3 > 662 - 676
IEEE Electron Device Letters > 2015 > 36 > 10 > 1082 - 1084
IEEE Electron Device Letters > 2009 > 30 > 8 > 867 - 869
European Journal of Operational Research > 2008 > 189 > 3 > 1118-1132