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This paper presents a new multi-level EDT scheme to reduce scan channels of scan-based SoC designs. Multi-level EDT requires trivial modification on existing EDT scheme with two-pass encoding. Experimental results show that this scheme can reduce channel count by up to 30% without penalty of test coverage and pattern count.
This paper presents a novel and efficient code, named MFDR (modified frequency-directed run-length) , for test data compression. The proposed code is a class of variable-to-variable-length prefix code. Both theoretical analysis and experimental results indicate that when the probability of 0s in the test set is greater than 0.8565, it can acquire better compression efficiency than FDR code, and compared...
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