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Hydrogen (1H) trapped at intermetallic particles (IPs) in an aluminum alloy, 6061-T6, was visualized with secondary ion mass spectrometry (SIMS) by precisely excluding the false signal which is caused by background hydrogen (HBG). The interference of the HBG was avoided by a unique continuous pre-sputtering (pre-digging) by a primary ion beam of SIMS into a sample in combination with silicon sputtering...
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