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Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4′‐bis[N‐(1‐naphthyl‐1‐)‐N‐phenyl‐ amino]‐biphenyl (NPB) and aluminium tris‐(8‐hydroxyquinolate) (Alq3), materials commonly used in organic light‐emitting diodes industry, was carried out using time‐of‐flight SIMS in dual beam mode. The sample used in this study consists of a ~400‐nm‐thick...
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