Search results for: Wei
2010 2nd International Conference on Software Technology and Engineering > 2 > V2-240 - V2-243
Proceedings of the 2010 American Contrl Conference > 5296 - 5301
2009 International Conference on Test and Measurement > 1 > 263 - 266
IEEE Control Systems Magazine > 2009 > 29 > 5 > 93 - 101