Search results for: Wei
2010 International Conference on Machine Learning and Cybernetics > 5 > 2345 - 2349
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 921 - 932
IEEE Transactions on Reliability > 2010 > 59 > 2 > 440 - 446
IEEE Design & Test of Computers > 2009 > 26 > 1 > 26 - 35
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2007 > 15 > 5 > 505 - 517
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2001 > 9 > 5 > 730 - 735