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In this paper we present results of SEM, XRD and EXAFS studies of palladium-carbon nanostructural films prepared in two-steps method on pure and oxidized silicon substrates. Structural, topographical and morphological differences were found between films deposited on those substrates.
Characterisation of C-Pd films composed of carbon and palladium nanograins and obtained in two-steps method is presented. Film obtained in first step exhibits multiphase structure composed of nanograins of fullerenes, amorphous carbon and palladium nanocrystals. This film is modified in CVD process. Final films has porous carbonaceous form. All films were studied by scanning electron microscopy (SEM),...
The stages of fullerenes-Ni film growth were studied with scanning force microscopy. In the first stage the formation of separated fullerenes grains and Ni nanocrystals were observed. In later stages the interaction between growing objects and agglomeration process of Ni nanocrystals could be noticed. Scanning electron microscopy and transmission electron microscopy were used to obtain information...
We present a photoelectric investigation of C 60 /C 70 +Ni films. Two kinds of films were investigated: containing 5 and 11wt% of Ni. Electron transmission microscopy and atomic force microscopy were applied to study the film structure and topography. Photoelectric work function experiment was performed in the UHV chamber where the sample was placed in a special holder enabling...
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