2013 IEEE International Electron Devices Meeting > 10.4.1 - 10.4.4
2013 IEEE International Electron Devices Meeting > 10.2.1 - 10.2.4
2013 IEEE International Electron Devices Meeting > 4.7.1 - 4.7.4
2013 IEEE International Electron Devices Meeting > 5.2.1 - 5.2.4
2013 IEEE International Electron Devices Meeting > 5.4.1 - 5.4.4
2013 IEEE International Electron Devices Meeting > 5.1.1 - 5.1.4
2013 IEEE International Electron Devices Meeting > 4.6.1 - 4.6.4
2013 IEEE International Electron Devices Meeting > 4.5.1 - 4.5.4
2013 IEEE International Electron Devices Meeting > 5.3.1 - 5.3.4
2013 IEEE International Electron Devices Meeting > 1.2.1 - 1.2.8
2013 IEEE International Electron Devices Meeting > 2.7.1 - 2.7.4
2013 IEEE International Electron Devices Meeting > 8.4.1 - 8.4.4
2013 IEEE International Electron Devices Meeting > 7.6.1 - 7.6.4
2013 IEEE International Electron Devices Meeting > 7.4.1 - 7.4.4
2013 IEEE International Electron Devices Meeting > 7.5.1 - 7.5.4
2013 IEEE International Electron Devices Meeting > 8.3.1 - 8.3.4
2013 IEEE International Electron Devices Meeting > 8.2.1 - 8.2.4
2013 IEEE International Electron Devices Meeting > 28.1.1 - 28.1.4
2013 IEEE International Electron Devices Meeting > 26.7.1 - 26.7.3