2013 IEEE International Electron Devices Meeting > 29.3.1 - 29.3.4
2013 IEEE International Electron Devices Meeting > 28.6.1 - 28.6.4
2013 IEEE International Electron Devices Meeting > 28.2.1 - 28.2.4
2013 IEEE International Electron Devices Meeting > 29.2.1 - 29.2.4
2013 IEEE International Electron Devices Meeting > 14.4.1 - 14.4.4
2013 IEEE International Electron Devices Meeting > 15.3.1 - 15.3.4
2013 IEEE International Electron Devices Meeting > 15.5.1 - 15.5.4
2013 IEEE International Electron Devices Meeting > 11.6.1 - 11.6.4
2013 IEEE International Electron Devices Meeting > 11.7.1 - 11.7.4
2013 IEEE International Electron Devices Meeting > 12.2.1 - 12.2.4
2013 IEEE International Electron Devices Meeting > 11.3.1 - 11.3.4
2013 IEEE International Electron Devices Meeting > 12.5.1 - 12.5.4
2013 IEEE International Electron Devices Meeting > 11.5.1 - 11.5.4
2013 IEEE International Electron Devices Meeting > 10.7.1 - 10.7.4
2013 IEEE International Electron Devices Meeting > 10.1.1 - 10.1.4
2013 IEEE International Electron Devices Meeting > 10.8.1 - 10.8.4
2013 IEEE International Electron Devices Meeting > 1.1.1 - 1.1.7
2013 IEEE International Electron Devices Meeting > 1.3.1 - 1.3.8
2013 IEEE International Electron Devices Meeting > 4.2.1 - 4.2.4
2013 IEEE International Electron Devices Meeting > 19.4.1 - 19.4.4