Search results for: Sebastian M. Sattler
Journal of Electronic Testing > 2016 > 32 > 4 > 491-503
Journal of Electronic Testing > 2013 > 29 > 5 > 697-714
Journal of Electronic Testing > 2016 > 32 > 4 > 491-503
Journal of Electronic Testing > 2013 > 29 > 5 > 697-714