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IEEE Electron Device Letters > 2018 > 39 > 1 > 143 - 146
IEEE Electron Device Letters > 2018 > 39 > 1 > 131 - 134
IEEE Electron Device Letters > 2018 > 39 > 1 > 59 - 62
IEEE Electron Device Letters > 2018 > 39 > 1 > 135 - 138
IEEE Electron Device Letters > 2018 > 39 > 1 > 147 - 150
IEEE Electron Device Letters > 2018 > 39 > 1 > 75 - 78
IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 243 - 250
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 72 - 78
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 356 - 360
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 142 - 149
IEEE Electron Device Letters > 2018 > 39 > 1 > 15 - 18
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 237 - 242
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 79 - 86
IEEE Electron Device Letters > 2018 > 39 > 1 > 67 - 70
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 31 - 37
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 191 - 198
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 299 - 307
IEEE Electron Device Letters > 2018 > 39 > 1 > 127 - 130
IEEE Electron Device Letters > 2018 > 39 > 1 > 47 - 50