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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 722 - 726
IEEE Transactions on Industrial Electronics > 2017 > 64 > 12 > 9709 - 9715
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5230 - 5235
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5128 - 5133
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4974 - 4979
IEEE Internet of Things Journal > 2017 > 4 > 6 > 1978 - 1986
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5093 - 5098
IEEE Transactions on Plasma Science > 2017 > 45 > 12-2 > 3300 - 3305
IEEE Instrumentation & Measurement Magazine > 2017 > 20 > 6 > 8 - 15
IEEE Photonics Journal > 2017 > 9 > 6 > 1 - 7
IEEE Sensors Journal > 2017 > 17 > 23 > 7641 - 7648
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 616 - 623
IEEE Transactions on Energy Conversion > 2017 > 32 > 4 > 1630 - 1632
IEEE Sensors Journal > 2017 > 17 > 23 > 7621 - 7629
IEEE Sensors Journal > 2017 > 17 > 23 > 7803 - 7811
IEEE Sensors Journal > 2017 > 17 > 23 > 7630 - 7640
IEEE Transactions on Industrial Informatics > 2017 > 13 > 6 > 3124 - 3133
IEEE Transactions on Industrial Electronics > 2017 > 64 > 12 > 9334 - 9343
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 12 > 2149 - 2153